Abstract

A relaxation method is used to adjust the thicknesses of the films of a multilayer in order to alter its transmission characteristics in a limited spectral region. This method is used to modify the spectral transmission of a short-wavelength pass multilayer and a broad-band dielectric mirror. The computations also furnish information useful in controlling the thicknesses of the layers in the fabrication of a multilayer.

© 1958 Optical Society of America

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References

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  1. W. W. Weinstein, Vacuum 4, 3 (1954).
    [CrossRef]
  2. P. W. Baumeister and J. M. Stone, J. Opt. Soc. Am. 46, 228 (1956).
    [CrossRef]

1956 (1)

1954 (1)

W. W. Weinstein, Vacuum 4, 3 (1954).
[CrossRef]

J. Opt. Soc. Am. (1)

Vacuum (1)

W. W. Weinstein, Vacuum 4, 3 (1954).
[CrossRef]

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Figures (3)

Fig. 1
Fig. 1

Computed reflectance as a function of wavelength of the multilayers designated as design I (shown as a dashed line) and design IX (shown as a solid line). The thicknesses and indices of refraction of the films of these multilayers are shown in Table I.

Fig. 2
Fig. 2

Computed reflectance as a function of wavelength of the multilayers whose designs are shown in Table I.

Fig. 3
Fig. 3

Computed reflectance as a function of wavelength of the dielectric mirrors whose designs are shown in Table II.

Tables (2)

Tables Icon

Table I Optical thickness and index of refraction of each of the films of the multilayers whose reflectance curves are shown in Figs. (1) and (2).

Tables Icon

Table II Optical thickness and index of refraction of each of the films of the dielectric mirrors whose reflectance curves are shown in Fig. (3).

Equations (2)

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δ R j = - δ T j = i = 1 l R j t i δ t i + ( second order terms ) ,
i = 1 l ( δ t i ) 2