Abstract

The number of forms of interference microscope which have been described is growing yearly, and this paper presents an analysis of the various types in terms of the qualities desirable in an interference microscope.

Three classes are recognized based on the manner in which the reference field differs from the image field. several instruments in each class are discussed, and it is concluded that, so far, the design of interference microscopes is of the nature of a compromise, some qualities being sacrificed in order to obtain others.

A current example of such a compromise is described, where accuracy of path difference measurement is the desired end.

© 1957 Optical Society of America

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References

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  1. W. Linnik, see W. Kinder, Z. Nachrichten (August, 1937).
  2. K. J. Habel (private communication).
  3. F. H. Smith, British Patent639,014, June21, 1950.
  4. J. Dyson, Nature 171, 743 (1953).
    [CrossRef] [PubMed]
  5. J. Dyson, Proc. Roy. Soc. (London) A204, 170–187 (1950).
  6. J. St and L. Philpot, Contraste de Phase et Contraste par Interferences (Editions de la Revue d’Optique, Paris, 1952), pp. 42–47.
  7. A. A. Lebedev, Rev. opt. 9, 385 (1930).
  8. J. Jamin, Compt. rend. 67, 814 (1868).
  9. F. H. Smith, Research 8, 385–395 (1955).
  10. F. H. Smith, British Patent639,014, June21, 1950.
  11. M. Françon, Le Microscope à Contraste de Phase et le Microscope Interférentiel (Editions du Centre National de la Recherche Scientifique, Paris, 1954), p. 113.
  12. J. Dyson, Proc. Roy. Soc. (London) A216, 493–501 (1952).
  13. J. Dyson, Engineering 179, 274–276 (1955).
  14. E. Zehender, see A. Kohaut, Werkstatt u. Betreib 86(12), 725–732 (1953).

1955 (2)

F. H. Smith, Research 8, 385–395 (1955).

J. Dyson, Engineering 179, 274–276 (1955).

1953 (2)

E. Zehender, see A. Kohaut, Werkstatt u. Betreib 86(12), 725–732 (1953).

E. Zehender, see A. Kohaut, Werkstatt u. Betreib 86(12), 725–732 (1953).

J. Dyson, Nature 171, 743 (1953).
[CrossRef] [PubMed]

1952 (1)

J. Dyson, Proc. Roy. Soc. (London) A216, 493–501 (1952).

1950 (1)

J. Dyson, Proc. Roy. Soc. (London) A204, 170–187 (1950).

1937 (1)

W. Linnik, see W. Kinder, Z. Nachrichten (August, 1937).

W. Linnik, see W. Kinder, Z. Nachrichten (August, 1937).

1930 (1)

A. A. Lebedev, Rev. opt. 9, 385 (1930).

1868 (1)

J. Jamin, Compt. rend. 67, 814 (1868).

Dyson, J.

J. Dyson, Engineering 179, 274–276 (1955).

J. Dyson, Nature 171, 743 (1953).
[CrossRef] [PubMed]

J. Dyson, Proc. Roy. Soc. (London) A216, 493–501 (1952).

J. Dyson, Proc. Roy. Soc. (London) A204, 170–187 (1950).

Françon, M.

M. Françon, Le Microscope à Contraste de Phase et le Microscope Interférentiel (Editions du Centre National de la Recherche Scientifique, Paris, 1954), p. 113.

Habel, K. J.

K. J. Habel (private communication).

Jamin, J.

J. Jamin, Compt. rend. 67, 814 (1868).

Kinder, W.

W. Linnik, see W. Kinder, Z. Nachrichten (August, 1937).

Kohaut, A.

E. Zehender, see A. Kohaut, Werkstatt u. Betreib 86(12), 725–732 (1953).

Lebedev, A. A.

A. A. Lebedev, Rev. opt. 9, 385 (1930).

Linnik, W.

W. Linnik, see W. Kinder, Z. Nachrichten (August, 1937).

Philpot, L.

J. St and L. Philpot, Contraste de Phase et Contraste par Interferences (Editions de la Revue d’Optique, Paris, 1952), pp. 42–47.

Smith, F. H.

F. H. Smith, Research 8, 385–395 (1955).

F. H. Smith, British Patent639,014, June21, 1950.

F. H. Smith, British Patent639,014, June21, 1950.

St, J.

J. St and L. Philpot, Contraste de Phase et Contraste par Interferences (Editions de la Revue d’Optique, Paris, 1952), pp. 42–47.

Zehender, E.

E. Zehender, see A. Kohaut, Werkstatt u. Betreib 86(12), 725–732 (1953).

Compt. rend. (1)

J. Jamin, Compt. rend. 67, 814 (1868).

Engineering (1)

J. Dyson, Engineering 179, 274–276 (1955).

Nature (1)

J. Dyson, Nature 171, 743 (1953).
[CrossRef] [PubMed]

Proc. Roy. Soc. (London) (2)

J. Dyson, Proc. Roy. Soc. (London) A204, 170–187 (1950).

J. Dyson, Proc. Roy. Soc. (London) A216, 493–501 (1952).

Research (1)

F. H. Smith, Research 8, 385–395 (1955).

Rev. opt. (1)

A. A. Lebedev, Rev. opt. 9, 385 (1930).

Werkstatt u. Betreib (1)

E. Zehender, see A. Kohaut, Werkstatt u. Betreib 86(12), 725–732 (1953).

Z. Nachrichten (1)

W. Linnik, see W. Kinder, Z. Nachrichten (August, 1937).

Other (5)

K. J. Habel (private communication).

F. H. Smith, British Patent639,014, June21, 1950.

J. St and L. Philpot, Contraste de Phase et Contraste par Interferences (Editions de la Revue d’Optique, Paris, 1952), pp. 42–47.

F. H. Smith, British Patent639,014, June21, 1950.

M. Françon, Le Microscope à Contraste de Phase et le Microscope Interférentiel (Editions du Centre National de la Recherche Scientifique, Paris, 1954), p. 113.

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Figures (1)

Fig. 1
Fig. 1

Method for suppression of the black borderline in half-shadow measurements.