Abstract

Infrared index of refraction data are presented for single crystal germanium and silicon. Also included are data for a modified selenium glass.

© 1957 Optical Society of America

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References

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  1. McAlister, Villa, and Salzberg, J. Opt. Soc. Am. 46, 485 (1956).
    [Crossref]
  2. H. B. Briggs, Phys. Rev. 77, 287 (1950).
    [Crossref]

1956 (1)

1950 (1)

H. B. Briggs, Phys. Rev. 77, 287 (1950).
[Crossref]

J. Opt. Soc. Am. (1)

Phys. Rev. (1)

H. B. Briggs, Phys. Rev. 77, 287 (1950).
[Crossref]

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Figures (4)

Fig. 1
Fig. 1

Index of refraction of single-crystal germanium and transmission through a 1.0-mm thick sample.

Fig. 2
Fig. 2

Index of refraction of single-crystal silicon and transmission through a 2.0-mm thick sample.

Fig. 3
Fig. 3

Index of refraction of modified selenium glass and transmission through a 2.0-mm thick sample.

Fig. 4
Fig. 4

Comparison of index values at shorter wavelengths with those published by Briggs in 1950. Curves A and B are Briggs’ germanium and silicon data, curves C and D are recent data.

Tables (3)

Tables Icon

Table I Index of refraction of single-crystal germanium (27°C).

Tables Icon

Table II Index of refraction of single-crystal silicon (26°C).

Tables Icon

Table III Index of refraction of modified selenium glass (27°C).