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Semiautomatic Method for Spectroscopic Wavelength and Intensity Measurements

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Abstract

An arrangement is described by which spectroscopic wavelength measurements are greatly simplified with an increase in accuracy. The measuring microscope is replaced by a photoelectric scanning device which displays line contours on an oscilloscope screen. The comparator readings are made automatically with electronic devices, and the results either recorded with an automatic typewriter or punched into cards or both. Photographic densities are measured and recorded at the same time. The data are then further processed by electronic calculating machines.

The equipment is built largely from commercially available components. Its operation is simple and foolproof. The various stages are independent of each other and can be introduced singly or in combination as desired.

© 1956 Optical Society of America

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