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References

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  1. S. Tolansky, Multiple Beam Interferometry of Surfaces and Films (Oxford University Press, New York, 1948).
  2. H. Wolter, “Schlieren-, Phasenkontrast-und Lichtschnittverfahren,” Encyclopedia of Physics, Fundamentals of Optics, edited by S. Flügge (Springer-Verlag, Berlin, 1956), Vol. XXIV, pp. 555–645.
  3. J. Meyer-Arendt, Science 123, 1176 (1956).
    [Crossref]

1956 (1)

J. Meyer-Arendt, Science 123, 1176 (1956).
[Crossref]

Meyer-Arendt, J.

J. Meyer-Arendt, Science 123, 1176 (1956).
[Crossref]

Tolansky, S.

S. Tolansky, Multiple Beam Interferometry of Surfaces and Films (Oxford University Press, New York, 1948).

Wolter, H.

H. Wolter, “Schlieren-, Phasenkontrast-und Lichtschnittverfahren,” Encyclopedia of Physics, Fundamentals of Optics, edited by S. Flügge (Springer-Verlag, Berlin, 1956), Vol. XXIV, pp. 555–645.

Science (1)

J. Meyer-Arendt, Science 123, 1176 (1956).
[Crossref]

Other (2)

S. Tolansky, Multiple Beam Interferometry of Surfaces and Films (Oxford University Press, New York, 1948).

H. Wolter, “Schlieren-, Phasenkontrast-und Lichtschnittverfahren,” Encyclopedia of Physics, Fundamentals of Optics, edited by S. Flügge (Springer-Verlag, Berlin, 1956), Vol. XXIV, pp. 555–645.

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Figures (1)

Fig. 1
Fig. 1

Schlieren pattern, obtained by incident light, of a glass surface with slight irregularities. Magnification 48 times.