Abstract

The design and operation of a calculator for determining thin film thicknesses measured by the multiple beam interferometer method is described. A photograph of the instrument and layout of the calculator dial is included.

© 1956 Optical Society of America

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References

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  1. S. Tolansky, Multiple Beam Interferometry (Clarendon Press, Oxford, 1948).
  2. Scott, McLauchlan, and Sennett, J. Appl. Phys. 21, 843 (1950).
    [Crossref]

1950 (1)

Scott, McLauchlan, and Sennett, J. Appl. Phys. 21, 843 (1950).
[Crossref]

McLauchlan,

Scott, McLauchlan, and Sennett, J. Appl. Phys. 21, 843 (1950).
[Crossref]

Scott,

Scott, McLauchlan, and Sennett, J. Appl. Phys. 21, 843 (1950).
[Crossref]

Sennett,

Scott, McLauchlan, and Sennett, J. Appl. Phys. 21, 843 (1950).
[Crossref]

Tolansky, S.

S. Tolansky, Multiple Beam Interferometry (Clarendon Press, Oxford, 1948).

J. Appl. Phys. (1)

Scott, McLauchlan, and Sennett, J. Appl. Phys. 21, 843 (1950).
[Crossref]

Other (1)

S. Tolansky, Multiple Beam Interferometry (Clarendon Press, Oxford, 1948).

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Figures (3)

Fig. 1
Fig. 1

Interferometer setup with calculator.

Fig. 2
Fig. 2

Typical fringe spectrum.

Fig. 3
Fig. 3

Layout of calculator.