Abstract

The design and operation of a calculator for determining thin film thicknesses measured by the multiple beam interferometer method is described. A photograph of the instrument and layout of the calculator dial is included.

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References

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  1. 1 S. Tolansky, Multiple Beam Interferometry (Clarendon Press, Oxford, 1948).
  2. Scott, McLauchlan, and Sennett, J. Appl. Phys. 21, 843 (1950).

Tolansky, S.

1 S. Tolansky, Multiple Beam Interferometry (Clarendon Press, Oxford, 1948).

Other (2)

1 S. Tolansky, Multiple Beam Interferometry (Clarendon Press, Oxford, 1948).

Scott, McLauchlan, and Sennett, J. Appl. Phys. 21, 843 (1950).

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