Abstract

An interferometer is described in which the two interfering light beams follow the same geometrical path; they differ in their direction of polarization. The interferometer is used for the measurement of a difference in the optical path between the lengths of two etalons I and II, each bounded by reflecting or semireflecting surfaces. By using plane polarized light, in each etalon a quarter wavelength plate at 45° with the plane of polarization, and an analyzer in the 90° position, interference will result between a beam (12) reflected by the top semireflecting mirror of I and the opaque one at the bottom of II, and a beam (21) reflected by the bottom mirror of I and the top one of II. Beams of other combinations of reflections are extinguished.

© 1956 Optical Society of America

Full Article  |  PDF Article
OSA Recommended Articles
Interference pattern of the Fizeau interferometer

T. T. Kajava, H. M. Lauranto, and A. T. Friberg
J. Opt. Soc. Am. A 11(7) 2045-2054 (1994)

Fizeau Interferometer for Measuring the Flatness of Optical Surfaces

R. Bünnagel, H.-A. Oehring, and K. Steiner
Appl. Opt. 7(2) 331-335 (1968)

Fringe Sharpening in Divided Beam Interferometers*

William Primak
J. Opt. Soc. Am. 48(6) 375-379 (1958)

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Figures (4)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription