Abstract

A purely interferometric method is suggested by which known standard wavelengths in the visible part of the spectrum are used to determine new wavelength standards in the infrared. The application of the method of exact fractions to measurements made using a Fabry-Perot interferometer whose plates are coated with highly reflecting dielectric films is discussed. It is shown that the large phase corrections introduced by these films may be reduced to differential corrections if relative wavelength measurements are made near wavelengths for which the phase change on reflection is π. A method of experimentally determining both the differential correction and wavelengths at which the phase change of π occurs is suggested.

© 1955 Optical Society of America

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References

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  1. K. W. Meissner, J. Opt. Soc. Am. 31, 405 (1941).
    [Crossref]
  2. Rank, Shull, Bennett, and Wiggins, J. Opt. Soc. Am. 43, 952 (1953).
    [Crossref]
  3. R. B. Muchmore, J. Opt. Soc. Am. 38, 20 (1948).
    [Crossref]
  4. P. J. Leurgans, J. Opt. Soc. Am. 41, 714 (1951)
    [Crossref]
  5. G. Kuwabara and K. Isiguro, J. Phys. Soc. (Japan) 7, 72 (1952).
    [Crossref]
  6. D. S. L. Durie, J. Opt. Soc. Am. 40, 878 (1950).
    [Crossref]
  7. J. L. Rood, J. Opt. Soc. Am. 39, 854 (1949).
    [Crossref]
  8. R. B. Sosman, The Properties of Silica (Chemical Catalog Company, Inc., New York, 1927), p. 591.
  9. C. Dufour, Ann. phys. 6, 5 (1951).

1953 (1)

1952 (1)

G. Kuwabara and K. Isiguro, J. Phys. Soc. (Japan) 7, 72 (1952).
[Crossref]

1951 (2)

1950 (1)

1949 (1)

1948 (1)

1941 (1)

Bennett,

Dufour, C.

C. Dufour, Ann. phys. 6, 5 (1951).

Durie, D. S. L.

Isiguro, K.

G. Kuwabara and K. Isiguro, J. Phys. Soc. (Japan) 7, 72 (1952).
[Crossref]

Kuwabara, G.

G. Kuwabara and K. Isiguro, J. Phys. Soc. (Japan) 7, 72 (1952).
[Crossref]

Leurgans, P. J.

Meissner, K. W.

Muchmore, R. B.

Rank,

Rood, J. L.

Shull,

Sosman, R. B.

R. B. Sosman, The Properties of Silica (Chemical Catalog Company, Inc., New York, 1927), p. 591.

Wiggins,

Ann. phys. (1)

C. Dufour, Ann. phys. 6, 5 (1951).

J. Opt. Soc. Am. (6)

J. Phys. Soc. (Japan) (1)

G. Kuwabara and K. Isiguro, J. Phys. Soc. (Japan) 7, 72 (1952).
[Crossref]

Other (1)

R. B. Sosman, The Properties of Silica (Chemical Catalog Company, Inc., New York, 1927), p. 591.

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Figures (2)

Fig. 1
Fig. 1

Curves A and B show the theoretical reflectivity plotted vs wavelength for one ZnS film and a triple layer ZnS–MgF2–ZnS film on a quartz substrate. Curves C and D, respectively, show the phase variation introduced on reflection from air-to-film-to-air for these films. Constant indices were assumed and the optical thickness of all films was chosen to be 4183 A.

Fig. 2
Fig. 2

Curves A and B show the theoretical reflectivity plotted vs wavelength for two triple layer ZnS–MgF2–ZnS films of equal and unequal optical thickness but the same resultant match point on quartz substrate. Curve C shows the phase variation on reflection from air-to-film-to-air common to the resultant films.

Equations (7)

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N λ = 2 ( n t * + λ 2 + λ δ 2 π ) ,
N * ( N ¯ - δ π ) = 2 n t * λ .
N 1 = 2 n t 1 * + d 1 λ 1 2 n t 1 λ 1 ; N 2 = 2 n t 2 * + d 1 λ 1 2 n t 2 λ 1 ; N 3 = 2 n t 1 * + d 2 λ 2 = 2 n t 1 + d 2 - d 1 λ 2 = 2 n t 1 + d λ 2 ; N 4 = 2 n t 2 * + d 2 λ 2 = 2 n t 2 + d 2 - d 1 λ 2 = 2 n t 2 + d λ 2 .
d N = d λ 2 = 1 - λ 1 λ 2 + 1 π ( δ 2 - δ 1 λ 1 λ 2 ) = 2 n t 2 * ( ρ 2 - ρ 1 ) λ 2 ( 1 - ρ 2 ) ,
d N ¯ = 1 π ( δ 2 - δ 1 λ 1 λ 2 ) = 2 n t 2 * ( ρ ¯ 2 - ρ ¯ 1 ) λ 2 ( 1 - ρ ¯ 2 ) .
Y s + 1 = n s n s + 1 Y s + i tan ( 2 π n s + 1 t λ ) 1 + i n s n s + 1 Y s tan ( 2 π n s + 1 t λ ) ,
R s = n s - n s - 1 Y s n s + n s - 1 Y s .