An Integrating Sphere for Measuring Diffuse Reflectance in the Near Infrared

John A. Jacquez; Wayne McKeehan; John Huss; James M. Dimitroff; Hans F. Kuppenheim

doi:10.1364/JOSA.45.000781

Journal of the Optical Society of America
Vol. 45,
Issue 10,
pp. 781-785
(1955)
•https://doi.org/10.1364/JOSA.45.000781

An Integrating Sphere for Measuring Diffuse Reflectance in the Near Infrared

John A. Jacquez, Wayne McKeehan, John Huss, James M. Dimitroff, and Hans F. Kuppenheim

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John A. Jacquez, Wayne McKeehan, John Huss, James M. Dimitroff, and Hans F. Kuppenheim, "An Integrating Sphere for Measuring Diffuse Reflectance in the Near Infrared," J. Opt. Soc. Am. 45, 781-785 (1955)

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Abstract

The construction and performance of a $4 \frac{1}{4} -in.$ diameter comparison type integrating sphere for a spectrophotometer designed by W. L. Derksen and T. I. Monahan is described. This combination allows the measurement of diffuse spectral reflectance in the near infrared to 2.6μ with an accuracy of 1%.

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λ/μ	$\frac{r_{vitrolite}}{r_{MgO}}$	95% confidence limits	λ/μ	$\frac{r_{vitrolite}}{r_{MgO}}$	95% confidence limits
0.707	0.881	0.002	1.81	0.697	0.002
0.731	0.877	0.001	1.85	0.679	0.001
0.760	0.868	0.001	1.89	0.663	0.003
0.788	0.861	0.001	1.93	0.646	0.002
0.823	0.849	0.001	1.96	0.625	0.002
0.858	0.844	0.001	2.00	0.607	0.002
0.895	0.835	0.002	2.04	0.588	0.002
0.934	0.833	0.002	2.07	0.571	0.001
0.976	0.833	0.004	2.11	0.553	0.002
1.02	0.825	0.002	2.15	0.530	0.002
1.07	0.820	0.001	2.18	0.487	0.002
1.11	0.817	0.001	2.22	0.467	0.001
1.16	0.814	0.002	2.25	0.462	0.002
1.20	0.810	0.002	2.30	0.458	0.002
1.25	0.809	0.001	2.32	0.452	0.002
1.30	0.805	0.001	2.36	0.440	0.002
1.35	0.802	0.002	2.40	0.426	0.001
1.40	0.800	0.004	2.43	0.408	0.001
1.45	0.790	0.001	2.46	0.390	0.005
1.50	0.788	0.004	2.50	0.374	0.002
1.54	0.780	0.003	2.53	0.360	0.002
1.59	0.769	0.003	2.56	0.348	0.005
1.63	0.760	0.003	2.60	0.338	0.006
1.68	0.748	0.002	2.63	0.329	0.003
1.72	0.731	0.003	2.66	0.317	0.005
1.77	0.714	0.002

	Reflectance of a blue card			Reflectance of skin
λ/mμ	NML	GE	NML-GE	NML	GE	NML-GE
707	0.326	0.313	0.013	0.589	0.597	0.008
731	0.348	0.328	0.020	0.589	0.604	0.015
760	0.402	0.371	0.031	0.584	0.600	0.005
788	0.459	0.425	0.034	0.595	0.601	0.016
823	0.498	0.470	0.028	0.588	0.602	0.014
858	0.550	0.520	0.030	0.585	0.590	0.005
895	0.597	0.572	0.025	0.564	0.574	0.010
934	0.652	0.622	0.030	0.539	0.540	0.001
976	0.714	0.678	0.036	0.504	0.492	0.012

	NML		GE
λ/mμ	$\frac{r_{{MgCO}_{3}}}{r_{MgO}}$	95% confidence limits	$\frac{r_{{MgCO}_{3}}}{r_{MgO}}$	95% confidence limits	NML-GE
707	1.000	0.001	0.993	0.003	0.007
731	1.001	0.009	0.993	0.003	0.008
760	1.001	0.002	0.992	0.003	0.009
788	1.002	0.002	0.992	0.003	0.010
823	1.001	0.002	0.992	0.003	0.009
858	1.000	0.004	0.992	0.003	0.008
895	1.001	0.001	0.992	0.003	0.009
934	0.997	0.002	0.991	0.003	0.006
976	0.995	0.002	0.991	0.003	0.004

	Stray energy		Stray energy
λ/μ	$\frac{r_{b}}{r_{MgO}}$ ^a	λ/μ	$\frac{r_{b}}{r_{MgO}}$ ^a
0.731	0.003	1.85	0.007
0.788	0.003	1.93	0.007
0.858	0.003	2.00	0.008
0.934	0.003	2.07	0.008
1.02	0.003	2.15	0.008
1.11	0.005	2.22	0.008
1.20	0.005	2.30	0.008
1.30	0.005	2.36	0.008
1.40	0.005	2.43	0.008
1.50	0.005	2.50	0.008
1.59	0.006	2.56	0.008
1.68	0.006	2.63	0.009
1.77	0.006

λ/μ	Slit mm	Nominal band width mμ	Half band width calculated from lines of AH4 mercury arc mμ
0.731	0.110	6	13
0.858	0.085	6	17
1.02	0.055	4	20
1.20	0.050	4	20
1.40	0.055	5	24
1.59	0.060	5	25
1.77	0.068	6	20
1.93	0.078	6	18
2.07	0.088	6	20
2.22	0.105	6	20
2.36	0.128	7	18
2.50	0.162	7	22
2.63	0.250		30

Abstract

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Tables (5)

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Journal of the Optical Society of America