Abstract

The imaging properties of an optical system can be in many cases completely specified by a function of a single variable. A convenient function is the response to a sine wave test pattern as a function of “frequency,” i.e., lines/mm. The difficulty of experimentally providing such a test pattern can be avoided by measuring the response to a square wave (bar pattern) and calculating by a simple formula the corresponding sine wave response factor. The convenience of the sine wave response factor in calculating system performance is illustrated by application to a fluoroscopic imaging system.

PDF Article

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription