Abstract

The index of refraction of tellurium has been measured for single-crystal samples having 10<sup>17</sup> impurity atoms/cm<sup>3</sup> . The values were found to vary from 4.95 at 4µ to 4.85 at 8µ for radiation polarized with <i>E</i>-vector perpendicular to the <i>C</i>-axis and from 6.31 at 4µ to 6.20 at 8µ for the <i>E</i>-vector parallel to the <i>C</i>-axis.

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  1. H. B. Briggs, Phys. Rev. 77, 287 (1950).
  2. J. J. Loferski, Phys. Rev. 87, 905 (1952).
  3. Prepared according to the method of Elliott, Ambrose, and Temple. J. Opt. Soc. Am. 38, 212 (1948).
  4. This work was done by Allen Nussbaum at the University of Pennsylvania.
  5. T. S. Moss, Proc. Phys. Soc. (London) B65, 62 (1952).

Briggs, H. B.

H. B. Briggs, Phys. Rev. 77, 287 (1950).

Loferski, J. J.

J. J. Loferski, Phys. Rev. 87, 905 (1952).

Moss, T. S.

T. S. Moss, Proc. Phys. Soc. (London) B65, 62 (1952).

Other

H. B. Briggs, Phys. Rev. 77, 287 (1950).

J. J. Loferski, Phys. Rev. 87, 905 (1952).

Prepared according to the method of Elliott, Ambrose, and Temple. J. Opt. Soc. Am. 38, 212 (1948).

This work was done by Allen Nussbaum at the University of Pennsylvania.

T. S. Moss, Proc. Phys. Soc. (London) B65, 62 (1952).

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