Abstract

A Rayleigh Lowe Interferometer has been modified in such a way that phase changes resulting from transmission through very thin metallic films can be magnified by a factor of four. These phase changes were measured for a series of aluminum films of different thicknesses both for normal incidence and for an angle of incidence of 70° using light of wavelength 590 millimicrons. For the measurements at oblique incidence the light was plane polarized with the magnetic vector parallel and perpendicular to the plane of incidence. Reflection and transmission measurements were also made on each of these films for the same wavelength.

© 1953 Optical Society of America

The Effect of Vapor Incidence on the Structure of Evaporated Aluminum Films*

L. Holland
J. Opt. Soc. Am. 43(5) 376-380 (1953)

Intensity Measurements in the Vacuum Ultraviolet

K. Watanabe and Edward C. Y. Inn
J. Opt. Soc. Am. 43(1) 32-35 (1953)

Some Bands of Methyl Bromide in the Near Infrared under High Resolution*

D. H. Rank, H. D. Rix, and T. A. Wiggins
J. Opt. Soc. Am. 43(3) 157-162 (1953)

Interferometric Wavelength Measurement in the Infrared by the Method of Exact Orders.* Precision Measurement of the Index of Refraction of Air at 1.65μ

D. H. Rank, E. R. Shull, Jean M. Bennett, and T. A. Wiggins
J. Opt. Soc. Am. 43(11) 952-956 (1953)

Titanium Dioxide Films as Selective Reflectors of the Near-Infrared

Frank J. Studer and D. A. Cusano
J. Opt. Soc. Am. 43(6) 522-525 (1953)