Abstract

An x-ray spectrographic method has been developed for routine analysis of mixtures of zirconium and hafnium oxides in the range of concentrations from 0.5 to 99.5 percent hafnium in zirconium. The method makes use of the newly perfected x-ray fluorescence analysis equipment incorporating a Geiger tube together with associated scaling and recording circuits for measurment of intensities. A single analysis requires 5 to 10 minutes to complete, including preparation of sample and final calculations. The average percent deviation at concentrations of 1 percent hafnium is 3.3 percent and at 40 percent hafnium about 0.5 percent.

© 1952 Optical Society of America

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Corrections

D. M. Mortimore and P. A. Romans, "Errata," J. Opt. Soc. Am. 42, 989_5-989 (1952)
https://www.osapublishing.org/josa/abstract.cfm?uri=josa-42-12-989_5

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