Abstract

The total reflection of x-rays is applied to focusing the rays issuing from a fine slit. A method of computing the geometrical optics of surfaces of bent beams is given; it is shown that under certain conditions lateral aberrations for practical apertures are of the order of one micron or less. These results are confirmed by experiment.

© 1949 Optical Society of America

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Figures (11)

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Equations (20)

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