Abstract

A method has been devised for the spectrographic analysis of materials consisting of two or more principal components. One of the components is selected as a reference element. The ratios of the concentrations of the various component elements to the concentrations of the reference element in a set of standard samples are computed. These concentration ratios are plotted against spectral line intensity ratios to form the working curves. Having determined the intensity ratios for an unknown sample, its composition is readily computed from a set of simple equations.

Complete details of the application of the method to the analysis of ferro-silicon are given. Use of this method eliminates the necessity for adding a standardizing material to the sample or making approximations to correct for reference element dilution.

© 1947 Optical Society of America

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Figures (2)

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Equations (13)

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