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  1. W. Gerlach and E. Schweitzer, Foundations and Methods of Chemical Analysis by the Emission Spectrum (Adam Hilger, Ltd., London).
  2. A. Wendt and H. Heun, Zeits. f. Physik 93, 92–9 (1934).
  3. U. S. Patent No. 1,971,215.
  4. L. J. Spencer, J. Sci. Inst. 8, 229–32 (1931).
  5. U. S. Patent No. 1,902,109.

1934 (1)

A. Wendt and H. Heun, Zeits. f. Physik 93, 92–9 (1934).

1931 (1)

L. J. Spencer, J. Sci. Inst. 8, 229–32 (1931).

Gerlach, W.

W. Gerlach and E. Schweitzer, Foundations and Methods of Chemical Analysis by the Emission Spectrum (Adam Hilger, Ltd., London).

Heun, H.

A. Wendt and H. Heun, Zeits. f. Physik 93, 92–9 (1934).

Schweitzer, E.

W. Gerlach and E. Schweitzer, Foundations and Methods of Chemical Analysis by the Emission Spectrum (Adam Hilger, Ltd., London).

Spencer, L. J.

L. J. Spencer, J. Sci. Inst. 8, 229–32 (1931).

Wendt, A.

A. Wendt and H. Heun, Zeits. f. Physik 93, 92–9 (1934).

Other (5)

W. Gerlach and E. Schweitzer, Foundations and Methods of Chemical Analysis by the Emission Spectrum (Adam Hilger, Ltd., London).

A. Wendt and H. Heun, Zeits. f. Physik 93, 92–9 (1934).

U. S. Patent No. 1,971,215.

L. J. Spencer, J. Sci. Inst. 8, 229–32 (1931).

U. S. Patent No. 1,902,109.

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