Abstract

In planning the equipment for the recently established Institute of Applied Optics at the University of Rochester, it was decided to build a photographic lens testing bench, which should be suitable both for instruction to students and for research work. A description of the construction, adjustment, and use of the bench is given in the present paper.

In designing the bench, it was decided to use a distant point source of light or other suitable test object, and to mount the lens so that it can be rotated about a vertical axis through its second nodal point, and set at any desired obliquity up to 60°. The image formed by the lens is then examined with a microscope in the usual way. It was also decided to incorporate an automatic mechanism to ensure that the focusing point of the microscope is always in the ideal flat field which the lens should have; and further, to provide such auxiliary motions as are necessary to test telephoto lenses.

Scales are provided for the direct measurement of astigmatism, curvature of field, distortion, and oblique color; and by suitable means it is also possible to determine the amount of spherical and chromatic aberration should this be required. The range of focal lengths is from 5 to 60 cms with a provision for the direct measurement of the equivalent focal length and the back focus of the lens.

The bench contains within itself adequate means for making complete adjustments of all its parts, and for correctly setting the zeros of all scales.

The paper is divided into four sections:

  • I Theoretical considerations
  • II Mechanical construction of the bench
  • III Adjustments of the various parts
  • IV Criticisms of the design.

© 1932 Optical Society of America

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References

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  1. A similar mechanism is used in the lens testing bench made by Messrs R. and J. Beck, see Glazebrook ‘Dictionary of Applied Physics’  4, p. 5; and also by Messrs Adam Hilger Ltd. in their lens testing interferometers, see Trans. Opt. Soc. 22, 174; 1920–21and Proc. Opt. Conv.1926, p. 1032.
  2. Trans. Opt. Soc.,  23, 188; 1921–22.
  3. J.O.S.A.,  4, 1; 1920.
    [Crossref]
  4. There are other possible sources of error to be considered here; See J. A. TomkinsOn the Nodal Slide Method of FocometryPhil. Mag. 35, 21; 1918.
    [Crossref]
  5. J. Sc. Inst. 1, 209; 1923–24.
  6. By this term is meant the line through the horizontal axis of rotation of the lens holder, parallel to the left-hand rod on which the microscope carriage runs.
  7. Trans. Opt. Soc. 22, 235; 1920–21.
  8. Trans. Opt. Soc. 28, 37; 1926–27.
    [Crossref]

1920 (1)

J.O.S.A.,  4, 1; 1920.
[Crossref]

1918 (1)

There are other possible sources of error to be considered here; See J. A. TomkinsOn the Nodal Slide Method of FocometryPhil. Mag. 35, 21; 1918.
[Crossref]

Glazebrook,

A similar mechanism is used in the lens testing bench made by Messrs R. and J. Beck, see Glazebrook ‘Dictionary of Applied Physics’  4, p. 5; and also by Messrs Adam Hilger Ltd. in their lens testing interferometers, see Trans. Opt. Soc. 22, 174; 1920–21and Proc. Opt. Conv.1926, p. 1032.

Tomkins, J. A.

There are other possible sources of error to be considered here; See J. A. TomkinsOn the Nodal Slide Method of FocometryPhil. Mag. 35, 21; 1918.
[Crossref]

Dictionary of Applied Physics (1)

A similar mechanism is used in the lens testing bench made by Messrs R. and J. Beck, see Glazebrook ‘Dictionary of Applied Physics’  4, p. 5; and also by Messrs Adam Hilger Ltd. in their lens testing interferometers, see Trans. Opt. Soc. 22, 174; 1920–21and Proc. Opt. Conv.1926, p. 1032.

J. Sc. Inst. (1)

J. Sc. Inst. 1, 209; 1923–24.

J.O.S.A. (1)

J.O.S.A.,  4, 1; 1920.
[Crossref]

Phil. Mag. (1)

There are other possible sources of error to be considered here; See J. A. TomkinsOn the Nodal Slide Method of FocometryPhil. Mag. 35, 21; 1918.
[Crossref]

Trans. Opt. Soc. (3)

Trans. Opt. Soc.,  23, 188; 1921–22.

Trans. Opt. Soc. 22, 235; 1920–21.

Trans. Opt. Soc. 28, 37; 1926–27.
[Crossref]

Other (1)

By this term is meant the line through the horizontal axis of rotation of the lens holder, parallel to the left-hand rod on which the microscope carriage runs.

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Figures (10)

Fig. 1
Fig. 1

The Principle of the nodal slide.

Fig. 2
Fig. 2

The effect of distortion on image position.

Fig. 3
Fig. 3

Automatic flat-field mechanism.

Fig. 4
Fig. 4

Testing a telephoto lens on a nodal-slide bench.

Fig. 5
Fig. 5

Above: Side elevation of bench, obliquity zero. Below: Plan of bench, obliquity 15°.

Fig. 6
Fig. 6

Cross section through main bearing of nodal slide.

Fig. 7
Fig. 7

Cross section of microscope carriage.

Fig. 8
Fig. 8

Side view of microscope carriage.

Fig. 9
Fig. 9

General view of bench, when testing an ordinary lens at 15° obliquity.

Fig. 10
Fig. 10

General view of bench, when testing a telephoto lens at 10° obliquity.

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