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Analysis of gratings by the beam-propagation method

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Abstract

We demonstrate that the beam-propagation method can be employed to calculate the electric-field amplitude inside and outside a grating structure excited by an arbitrary incident field. We establish the accuracy of the method by comparing our results for constant-period gratings with results obtained from other theoretical methods. Subsequently, we analyze thick-focusing gratings with the beam-propagation method.

© 1982 Optical Society of America

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