Abstract

The mechanical rotation of an optical element around the axis of a beam of polarized light can be easily simulated by using the phenomenon of <i>optical</i> rotation. Because optical rotation can be magnetically or electrically induced, virtually any kind of mechanical rotation can be mimicked. This interesting principle is applied to the design of a new Fourier photopolarimeter that uses an oscillating-azimuth retarder (OAR). The OAR consists of a quarter-wave plate surrounded by two ac-excited Faraday cells that produce equal and opposite sinusoidal optical rotations. Analysis of the operation of this polarimeter of no moving parts proves its ability to measure all four Stokes parameters of incident partially polarized radiation.

© 1978 Optical Society of America

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References

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  1. G. E. Sommargren, "Up/down frequency shifter for optical hetrodyne interferometry," J. Opt. Soc. Am. 65, 960–961 (1975).
  2. K. Serkowski, "Polarimeters for optical astronomy," in Planets, Stars and Nebulae Studied by Photopolarimetry, edited by T. Gehrels (University of Arizona Press, Tuscon, 1974). pp. 135–174.
  3. D. L. Coffeen, "Optical polarimeters in space," in Ref. 2, pp. 189–217.
  4. R. H. Muller, "Present status of automatic ellipsometers," Surf. Sci. 56, 19–36 (1976); also in Proceedings of the Third International Conference on Ellipsometry, edited by N. M. Bashara and R. M. A. Azzam (North-Holland, Amsterdam, 1976).
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  6. P. S. Hauge, "Survey of methods for the complete determination of a state of polarization," in Polarized Light: Instruments, Devices, and Applications, edited by W. L. Hyde and R. M. A. Azzam; alsoinProc. Soc. Photo-Opt. Instrum., Eng., 88, pp. 3–10 (1976).
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  10. See, for example, D. Clarke and J. F. Grainger, Polarized Light and Optical Measurement (Pergamon, New York, 1971), p. 124.
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1976 (4)

R. H. Muller, "Present status of automatic ellipsometers," Surf. Sci. 56, 19–36 (1976); also in Proceedings of the Third International Conference on Ellipsometry, edited by N. M. Bashara and R. M. A. Azzam (North-Holland, Amsterdam, 1976).

D. E. Aspnes and P. S. Hauge, "Rotating-compensator/analyzer fixed analyzer ellipsometer: Analysis and comparison to other automatic ellipsometers," J. Opt. Soc. Am. 66, 949–954 (1976).

P. S. Hauge, "Survey of methods for the complete determination of a state of polarization," in Polarized Light: Instruments, Devices, and Applications, edited by W. L. Hyde and R. M. A. Azzam; alsoinProc. Soc. Photo-Opt. Instrum., Eng., 88, pp. 3–10 (1976).

R. M. A. Azzam, "Oscillating-analyzer ellipsometer," Rev. Sci. Instrum. 47, 624–628 (1976).

1975 (1)

1974 (1)

K. Serkowski, "Polarimeters for optical astronomy," in Planets, Stars and Nebulae Studied by Photopolarimetry, edited by T. Gehrels (University of Arizona Press, Tuscon, 1974). pp. 135–174.

1969 (1)

1957 (1)

1952 (1)

Aspnes, D. E.

Azzam, R. M. A.

R. M. A. Azzam, "Oscillating-analyzer ellipsometer," Rev. Sci. Instrum. 47, 624–628 (1976).

Billings, B. H.

Clarke, D.

See, for example, D. Clarke and J. F. Grainger, Polarized Light and Optical Measurement (Pergamon, New York, 1971), p. 124.

Coffeen, D. L.

D. L. Coffeen, "Optical polarimeters in space," in Ref. 2, pp. 189–217.

Grainger, J. F.

See, for example, D. Clarke and J. F. Grainger, Polarized Light and Optical Measurement (Pergamon, New York, 1971), p. 124.

Hauge, P. S.

P. S. Hauge, "Survey of methods for the complete determination of a state of polarization," in Polarized Light: Instruments, Devices, and Applications, edited by W. L. Hyde and R. M. A. Azzam; alsoinProc. Soc. Photo-Opt. Instrum., Eng., 88, pp. 3–10 (1976).

D. E. Aspnes and P. S. Hauge, "Rotating-compensator/analyzer fixed analyzer ellipsometer: Analysis and comparison to other automatic ellipsometers," J. Opt. Soc. Am. 66, 949–954 (1976).

Kemp, J. C.

Muller, R. H.

R. H. Muller, "Present status of automatic ellipsometers," Surf. Sci. 56, 19–36 (1976); also in Proceedings of the Third International Conference on Ellipsometry, edited by N. M. Bashara and R. M. A. Azzam (North-Holland, Amsterdam, 1976).

Sekera, Z.

Serkowski, K.

K. Serkowski, "Polarimeters for optical astronomy," in Planets, Stars and Nebulae Studied by Photopolarimetry, edited by T. Gehrels (University of Arizona Press, Tuscon, 1974). pp. 135–174.

Sommargren, G. E.

J. Opt. Soc. Am. (5)

Rev. Sci. Instrum. (1)

R. M. A. Azzam, "Oscillating-analyzer ellipsometer," Rev. Sci. Instrum. 47, 624–628 (1976).

Other (6)

See, for example, D. Clarke and J. F. Grainger, Polarized Light and Optical Measurement (Pergamon, New York, 1971), p. 124.

Handbook of Mathematical Functions, edited by M. Abramowitz and J. A. Stegun (Dover, New York, 1965), p. 361.

P. S. Hauge, "Survey of methods for the complete determination of a state of polarization," in Polarized Light: Instruments, Devices, and Applications, edited by W. L. Hyde and R. M. A. Azzam; alsoinProc. Soc. Photo-Opt. Instrum., Eng., 88, pp. 3–10 (1976).

K. Serkowski, "Polarimeters for optical astronomy," in Planets, Stars and Nebulae Studied by Photopolarimetry, edited by T. Gehrels (University of Arizona Press, Tuscon, 1974). pp. 135–174.

D. L. Coffeen, "Optical polarimeters in space," in Ref. 2, pp. 189–217.

R. H. Muller, "Present status of automatic ellipsometers," Surf. Sci. 56, 19–36 (1976); also in Proceedings of the Third International Conference on Ellipsometry, edited by N. M. Bashara and R. M. A. Azzam (North-Holland, Amsterdam, 1976).

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