Abstract

The effects of diffraction and interference on the images of sharp edges and slits viewed through amplitude diffraction gratings have been measured. The parameters investigated were grating line pitch, object-plane to grating-plane distance, and width of object slit. Microdensitometer tracings and isodensitograms of representative examples are included in the paper.

© 1969 Optical Society of America

Full Article  |  PDF Article

References

  • View by:
  • |
  • |
  • |

  1. P. S. Theocaris, A. P. Vafiadakis, and C. Liakopoulos, J. Opt. Soc. Am. 58, 1092 (1968).
    [CrossRef]
  2. J. Guild, The Interference Systems of Crossed Diffraction Gratings (Oxford University Press, London, 1956), p. 92.
  3. J. Guild, Diffraction Gratings as Measuring Scales (Oxford University Press, London, 1962), p. 66.
  4. G. S. Holister and A. R. Luxmoore, Exp. Mech. 8, 210 (1968).
    [CrossRef]
  5. F. A. Jenkins and H. E. White, Fundamentals of Optics (McGraw–Hill Book Co., New York, 1956), pp. 311 and 376.
  6. P. S. Theocaris, Materialprüfung 10, 245 (1968).
  7. D. L. Sturgeon, Exp. Mech. 7, 346 (1967).
    [CrossRef]

1968 (3)

P. S. Theocaris, A. P. Vafiadakis, and C. Liakopoulos, J. Opt. Soc. Am. 58, 1092 (1968).
[CrossRef]

G. S. Holister and A. R. Luxmoore, Exp. Mech. 8, 210 (1968).
[CrossRef]

P. S. Theocaris, Materialprüfung 10, 245 (1968).

1967 (1)

D. L. Sturgeon, Exp. Mech. 7, 346 (1967).
[CrossRef]

Guild, J.

J. Guild, The Interference Systems of Crossed Diffraction Gratings (Oxford University Press, London, 1956), p. 92.

J. Guild, Diffraction Gratings as Measuring Scales (Oxford University Press, London, 1962), p. 66.

Holister, G. S.

G. S. Holister and A. R. Luxmoore, Exp. Mech. 8, 210 (1968).
[CrossRef]

Jenkins, F. A.

F. A. Jenkins and H. E. White, Fundamentals of Optics (McGraw–Hill Book Co., New York, 1956), pp. 311 and 376.

Liakopoulos, C.

Luxmoore, A. R.

G. S. Holister and A. R. Luxmoore, Exp. Mech. 8, 210 (1968).
[CrossRef]

Sturgeon, D. L.

D. L. Sturgeon, Exp. Mech. 7, 346 (1967).
[CrossRef]

Theocaris, P. S.

Vafiadakis, A. P.

White, H. E.

F. A. Jenkins and H. E. White, Fundamentals of Optics (McGraw–Hill Book Co., New York, 1956), pp. 311 and 376.

Exp. Mech. (2)

G. S. Holister and A. R. Luxmoore, Exp. Mech. 8, 210 (1968).
[CrossRef]

D. L. Sturgeon, Exp. Mech. 7, 346 (1967).
[CrossRef]

J. Opt. Soc. Am. (1)

Materialprüfung (1)

P. S. Theocaris, Materialprüfung 10, 245 (1968).

Other (3)

J. Guild, The Interference Systems of Crossed Diffraction Gratings (Oxford University Press, London, 1956), p. 92.

J. Guild, Diffraction Gratings as Measuring Scales (Oxford University Press, London, 1962), p. 66.

F. A. Jenkins and H. E. White, Fundamentals of Optics (McGraw–Hill Book Co., New York, 1956), pp. 311 and 376.

Cited By

OSA participates in CrossRef's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (8)

Fig. 1
Fig. 1

Schematic representation of the optical arrangement.

Fig. 2
Fig. 2

Microdensity tracings of a single edge viewed through a 20-lines/mm amplitude diffraction grating at air gaps of zero, 0.01p/λ, 0.02p/λ, and 0.03p/λ mm, respectively. Larger-amplitude tracings show the density distributions across the plain edge (tracing magnification×500).

Fig. 3
Fig. 3

Microdensity tracings of a single edge viewed through a 20-lines/mm amplitude diffraction grating at air gaps of 0.10p/λ and 0.20p/λ mm, respectively. Larger-amplitude tracings show the density distribution across the plain edge (tracing magnification×100).

Fig. 4
Fig. 4

Graph of grating-line pitch to light-wavelength ratio against the displacement of the first-order diffracted image (where ○=3, ×=8, △=10, +=20, □=40, lines/mm).

Fig. 5
Fig. 5

Isodensitograms of wedge-shaped slits: (a) slit without grating, (b) slit (a) with a 20-lines/mm amplitude grating at air gap 0.03 p/λ mm, and (c) slit of larger included angle viewed through the same grating at air gap 1.00 p/λ mm (Isodensitogram magnifications×200, ×200, and ×20, respectively).

Fig. 6
Fig. 6

Microdensity tracings obtained along Secs. AA and BB shown in Fig. 5(a) (tracing magnification 200X).

Fig. 7
Fig. 7

Microdensity tracings obtained along Secs. AA and BB shown in Fig. 5(b) (tracing magnification 200X).

Fig. 8
Fig. 8

Microdensity tracings obtained along the sections shown in Fig. 5(c) and at object-slit widths 0.20, 0.45, 1.00, 1.30, 2.00, and 3.25 mm, respectively.

Equations (6)

Equations on this page are rendered with MathJax. Learn more.

( x - s / 2 ) = a tan θ ,
( x - s / 2 ) = a sin θ .
β = ± π = π b sin θ / λ ,
x n = ( n a λ / b ) + s / 2 ,
sin θ = m λ / p ,
x m = ( m a λ / p ) + s / 2 ,