Abstract

An analysis is made of the photometrically determined ratio of the reflectances for the components, polarized parallel and perpendicular to the plane of incidence. Given the experimentally determined minimum ratio R_∥/R_⊥. value and the angle of incidence, φ_B, at that minimum for a specular surface, an analytic determination of the real and imaginary parts of the dielectric constant can be made. Curves are given showing the limits for which certain successive simplifying approximations can be made that are consistent with experimental accuracy. Data for a GaSb sample at λ = 5800 Å are given with the computed values of ∊₁, ∊₂, and n and k.

© 1964 Optical Society of America

Effect of a Thin Surface Film on the Ellipsometric Determination of Optical Constants*

D. K. Burge and H. E. Bennett
J. Opt. Soc. Am. 54(12) 1428-1433 (1964)

Determining Optical Constants of Metals by Reflection of Elliptically Polarized Light*†

Frederick P. Mertens and Robert C. Plumb
J. Opt. Soc. Am. 54(8) 1063-1064 (1964)

Optical Constants of Vacuum-Evaporated Silver Films*

R. H. Huebner, E. T. Arakawa, R. A. MacRae, and R. N. Hamm
J. Opt. Soc. Am. 54(12) 1434-1437 (1964)

Determination of the Refractive Index of Thin Dielectric Films*

Michael Hacskaylo
J. Opt. Soc. Am. 54(2) 198-203 (1964)

Determination of the Absolute Phase Change on Reflection at Chromium Films

G. Henderson and C. Weaver
J. Opt. Soc. Am. 54(8) 1052-1056 (1964)