Abstract

A generalized representation of the radiation field incident on the photosensitive surface of a photoelectric device accommodates the consideration of many laser beams superposed or the consideration of radiation due to multimodes or multiple filaments of a single laser. The magnitudes and frequencies of the fluctuations in electron emission from the photosurface associated with photon noise and shot noise and the parameters affecting these magnitudes are determined. Also, the influence of these fluctuations on the probability of detecting low-level laser radiation is investigated.

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