Abstract

The reflectivity and transmissivity of Sb, Te, and Ti films have been measured in the range from 1600 to 450 A in order to compare the frequency at which the films change from a reflecting to a transmitting medium with the plasmà frequency predicted by Bohm and Pines and also with electron energy characteristic losses in metals observed by Marton <i>et al.</i> and by Powell.

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  1. F. Seitz, Modern Theory of Solids (McGraw-Hill Book Company, Inc., New York, 1940), Chaps. IV, XVII.
  2. M. Parker Givens, Solid State Physics, edited by F. Seitz and D. Turnbull (Academic Press Inc., 1958), Vol. 6, p.313.
  3. L. G. Schulz, Phil. Mag. Suppl. 6, 102 (1957).
  4. W. C. Walker, O. P. Rustgi, and G. L. Weissler, J. Opt. Soc. Am. 49, 471 (1959).
  5. N. N. Axelrod and M. Parker Givens, Phys. Rev. 120, 1205 (1960).
  6. D. Pines, Solid State Physics, edited by F. Seitz and D. Turnbull (Academic Press, Inc., New York, 1955), Vol. 1, p. 367.
  7. D. Pines, Revs. Modern Phys. 28, 184 (1956).
  8. S. Tolansky, Multiple Beam Interferometry of Surfaces and Films (Clarendon Press, Oxford, England, 1948).
  9. L. Marton, L. B. Leder, and H. Mendlowitz, Advances in Electronics and Electron Physics, edited by L. Marton (Academic Press Inc., New York, 1955), Vol. 7, p. 211.
  10. C. J. Powell, Proc. Phys. Soc. (London) 76, 593 (1960).
  11. H. Mendlowitz, J. Opt. Soc. Am. 50, 739 (1960).
  12. H. Fröhlich and H. Pelzer, Proc. Phys. Soc. (London) A68, 525 (1955).
  13. O. P. Rustgi, J. Nodvik, and G. L. Weissler, Phys. Rev. (to be published).

Axelrod, N. N.

N. N. Axelrod and M. Parker Givens, Phys. Rev. 120, 1205 (1960).

Fröhlich, H.

H. Fröhlich and H. Pelzer, Proc. Phys. Soc. (London) A68, 525 (1955).

Givens, M. Parker

N. N. Axelrod and M. Parker Givens, Phys. Rev. 120, 1205 (1960).

M. Parker Givens, Solid State Physics, edited by F. Seitz and D. Turnbull (Academic Press Inc., 1958), Vol. 6, p.313.

Leder, L. B.

L. Marton, L. B. Leder, and H. Mendlowitz, Advances in Electronics and Electron Physics, edited by L. Marton (Academic Press Inc., New York, 1955), Vol. 7, p. 211.

Marton, L.

L. Marton, L. B. Leder, and H. Mendlowitz, Advances in Electronics and Electron Physics, edited by L. Marton (Academic Press Inc., New York, 1955), Vol. 7, p. 211.

Mendlowitz, H.

L. Marton, L. B. Leder, and H. Mendlowitz, Advances in Electronics and Electron Physics, edited by L. Marton (Academic Press Inc., New York, 1955), Vol. 7, p. 211.

H. Mendlowitz, J. Opt. Soc. Am. 50, 739 (1960).

Nodvik, J.

O. P. Rustgi, J. Nodvik, and G. L. Weissler, Phys. Rev. (to be published).

Pelzer, H.

H. Fröhlich and H. Pelzer, Proc. Phys. Soc. (London) A68, 525 (1955).

Pines, D.

D. Pines, Solid State Physics, edited by F. Seitz and D. Turnbull (Academic Press, Inc., New York, 1955), Vol. 1, p. 367.

D. Pines, Revs. Modern Phys. 28, 184 (1956).

Powell, C. J.

C. J. Powell, Proc. Phys. Soc. (London) 76, 593 (1960).

Rustgi, O. P.

O. P. Rustgi, J. Nodvik, and G. L. Weissler, Phys. Rev. (to be published).

W. C. Walker, O. P. Rustgi, and G. L. Weissler, J. Opt. Soc. Am. 49, 471 (1959).

Schulz, L. G.

L. G. Schulz, Phil. Mag. Suppl. 6, 102 (1957).

Seitz, F.

F. Seitz, Modern Theory of Solids (McGraw-Hill Book Company, Inc., New York, 1940), Chaps. IV, XVII.

Tolansky, S.

S. Tolansky, Multiple Beam Interferometry of Surfaces and Films (Clarendon Press, Oxford, England, 1948).

Walker, W. C.

W. C. Walker, O. P. Rustgi, and G. L. Weissler, J. Opt. Soc. Am. 49, 471 (1959).

Weissler, G. L.

W. C. Walker, O. P. Rustgi, and G. L. Weissler, J. Opt. Soc. Am. 49, 471 (1959).

O. P. Rustgi, J. Nodvik, and G. L. Weissler, Phys. Rev. (to be published).

Other

F. Seitz, Modern Theory of Solids (McGraw-Hill Book Company, Inc., New York, 1940), Chaps. IV, XVII.

M. Parker Givens, Solid State Physics, edited by F. Seitz and D. Turnbull (Academic Press Inc., 1958), Vol. 6, p.313.

L. G. Schulz, Phil. Mag. Suppl. 6, 102 (1957).

W. C. Walker, O. P. Rustgi, and G. L. Weissler, J. Opt. Soc. Am. 49, 471 (1959).

N. N. Axelrod and M. Parker Givens, Phys. Rev. 120, 1205 (1960).

D. Pines, Solid State Physics, edited by F. Seitz and D. Turnbull (Academic Press, Inc., New York, 1955), Vol. 1, p. 367.

D. Pines, Revs. Modern Phys. 28, 184 (1956).

S. Tolansky, Multiple Beam Interferometry of Surfaces and Films (Clarendon Press, Oxford, England, 1948).

L. Marton, L. B. Leder, and H. Mendlowitz, Advances in Electronics and Electron Physics, edited by L. Marton (Academic Press Inc., New York, 1955), Vol. 7, p. 211.

C. J. Powell, Proc. Phys. Soc. (London) 76, 593 (1960).

H. Mendlowitz, J. Opt. Soc. Am. 50, 739 (1960).

H. Fröhlich and H. Pelzer, Proc. Phys. Soc. (London) A68, 525 (1955).

O. P. Rustgi, J. Nodvik, and G. L. Weissler, Phys. Rev. (to be published).

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