Abstract

Methods are described for measuring accurately the half-widths of frustrated total reflection filters (see reference 1) of very narrow pass bands, and for detecting extremely small non-uniformities in the spacer layers of these filters. The latter method, permitting observation and measurement of thin film non-uniformities appreciably less than one unit cell provides a very sensitive means of studying thin film structures and the mechanism of formation.

© 1949 Optical Society of America

Full Article  |  PDF Article
Related Articles
Versatile frustrated-total-reflection polarizer for the infrared

David Lees and Philip Baumeister
Opt. Lett. 4(2) 66-67 (1979)

The Frustrated Total Reflection Filter.I. Spectral Analysis

Leonard Bergstein and Carl Shulman
Appl. Opt. 5(1) 9-21 (1966)

Optical Tunneling and Its Applications to Optical Filters

Philip W. Baumeister
Appl. Opt. 6(5) 897-905 (1967)

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Figures (3)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Equations (23)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription