Abstract

The initially high reflection from zinc sulphide is still further enhanced by constructive interference in thin films. By distilling sphalerite in vacuum, thin films showing first order interference and reflecting white light brilliantly are produced. The application of such films to the metallographic microscope, Michelson interferometer and other instrument is discussed.

PDF Article

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription