Abstract

Following the approach of a prior integer linear programming network design model to provide specified dual-failure restorability levels, we develop a new model that allows for an enhanced dual-failure restorability approach. We observe that some dual-failure scenarios affecting a single p-cycle can, in fact, be partially restorable, contravening the typical understanding of p-cycle network restorability. We show that a p-cycle network that utilizes this enhanced dual-failure restorability can be designed more cost-effectively than one without it, saving as much as 20.01% in capacity design costs and averaging 7.93% over the test cases we studied.

© 2008 Optical Society of America

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