Abstract

We propose a method to analyze the performance variability caused by fabrication uncertainty in photonic circuits with a large number of correlated parameters. By combining a sparse polynomial chaos expansion model with dimensionality reduction in the form of Karhunen-Loève transform and principal component analysis, we demonstrate the stochastic analysis of the transfer function of cascaded Mach-Zehnder interferometers with up to 38 correlated uncertain parameters.

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