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Optica Publishing Group
  • Journal of Lightwave Technology
  • Vol. 35,
  • Issue 13,
  • pp. 2593-2597
  • (2017)

Detection of Refractive Index Change From the Critical Wavelength of an Etched Few Mode Fiber

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Abstract

A novel scheme for the detection of refractive index change based on the mode interference in a special few mode fiber (FMF) is proposed in this paper. The parameters and index profile of the FMF used in the measurement are specifically designed so that only LP01 and LP02 modes are transmitted within the operation wavelength, and the propagation constant difference Δβ between these two modes reaches maximum at critical wavelength (CWL). An inline Mach–Zehnder interferometric sensor for the detection of surrounding refractive index (SRI) is constructed by splicing FMF with two sections of conventional single mode fiber. We demonstrated at the first time that the CWL will change monotonically with the change of SRI in the measurement range of 1.316–1.439. The experimental sensitivity of the CWL increases with the increase of SRI. A sensitiviy of 140.626 ± 12.560 nm/RIU in the range of 1.316–1.383 and a maximum sensitivity of 2489.796 ± 190.179 nm/RIU in the range of 1.433–1.439 were obtained, respectively, in the experiment. At present parameters of the etched FMF, the limit of detection of the refractive index is 3.413 × 10–4 RIU in the SRI range of 1.316–1.383, and 1.928 × 10–5 RIU in the SRI range of 1.433–1.439, respectively. The detection of SRI via monitoring the shift of CWL is superior to the traditional detection method via monitoring merely the shift of peak or dip wavelength of the transmission spectrum, since the latter usually suffers from limited measurement range and multivalue problem because it is difficult to identify and follow one specific peak or dip from the transmission spectrum especially if the system needs to reset in practical application. The novel detection scheme based on monitoring the shift of the exclusive CWL of FMF is promising in practical applications.

© 2017 IEEE

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