Abstract

We report on the fabrication and optical properties of planar and channel waveguides in a CdS crystal using a C ion implantation technique combined with a standard photolithographic technique. The prism-coupling and the end-face coupling methods separately measure the guiding modes and the near-field intensity distribution of the light at 633 and 1539 nm. The refractive index profiles of the planar and channel waveguides are reconstructed at 633 and 1539 nm. The finite difference beam propagation method is used to simulate the guided mode profiles. There is excellent agreement between the measured and simulated modes at 633 and 1539 nm.

© 2014 IEEE

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