Abstract

Refractive index in special optical-damage-resistant MgO-diffused near-stoichiometric (NS) Ti:LiNbO<sub>3</sub> (Ti:LN) waveguide structure that a number of single-mode strip waveguides are embedded in a planar waveguide is profiled on the basis of the measured mode field profile of strip waveguide. In the NS strip waveguide, the Ti<sup>4+</sup>-induced extraordinary index increase studied follows a sum of two error functions in the width direction and a sum of two Gaussian functions in the depth direction. In the NS planar waveguide, the index increase follows a Gaussian function. On the basis of the established index profile model, the mode field profiles were calculated using variational method and compared with the measured data. The results show that the calculated mode sizes are in good agreement with the measured. In addition, the profile characteristics of Ti<sup>4+</sup>-concentration in both the strip and planar waveguides were analyzed by secondary ion mass spectrometry and are correlated with the refractive index increase. The result shows that the profile characteristics of the index increase and Ti<sup>4+</sup>-concentration are similar for both the strip and planar waveguides and there exists a linear relationship with a slope of ~2.0 × 10<sup>-3</sup>(mol%)<sup>-1</sup>.

© 2012 IEEE

PDF Article

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription