Abstract

We propose and demonstrate here the high efficiency of concurrent time and frequency analysis to detect and unambiguously identify the coupled cavities in real photonic crystals containing imperfections and/or process-induced disorder. This procedure when applied to reflectograms recorded using phase-sensitive optical low-coherence reflectometry allows a straightforward and complete assessment of cavities (spectral and spatial localization in addition to photon lifetime) over a wide spectral range. Considering such a reflectogram (recorded in ${\sim} {\hbox {2}}$ s), we show that this procedure greatly eases the evaluation of cavities under guiding conditions in real photonic crystals by discriminating their signature from the in-plane scattering induced by disorder.

© 2010 IEEE

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