Abstract
We propose a novel optimization algorithm for the extraction of material
complex refractive index in the terahertz (THz) frequency range. The
algorithm is applied for materials with arbitrary frequency dependence. We
utilize dispersive dielectric models for accurate parameter extraction of a
sample of unknown thickness. This approach allows for simultaneously
estimating the parameters and fitting them to one of the dispersive models
of the materials in the THz frequency range. Our approach has been
successfully illustrated through a number of examples with different
dispersive models. The examples include the characterization of doped
semiconductors used in surface plasmon plaritons in the THz regime. They
also include characterizing carbon nanotubes.
© 2010 IEEE
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