Abstract
A new polarization-sensitive optical coherence tomography (PS-OCT) system
is proposed for obtaining simultaneous measurements of the thickness, mean
group refractive index, apparent phase retardation, and optical axis orientation
of a linear birefringent material. The proposed PS-OCT system has no need
for a high-precision scanning stage or controller and utilizes a thermal light
source in order to enhance the resolution in the axial direction. Utilizing
the proposed PS-OCT system, a novel technique is proposed for obtaining direct
measurements of the group extraordinary and ordinary refractive indexes and
group birefringence properties of the linear birefringent sample, and it could
be used to inspect and verify the corresponding parameters of a sample. To
the best of the authors' knowledge, the system developed in this study is
the first system presented in the literature capable of obtaining simultaneous
measurements of the multiple optical parameters of a linear birefringent material.
As such, the PS-OCT system represents an ideal solution for industrial applications
in which a precise knowledge of the optical properties of a birefringent material
is required.
© 2009 IEEE
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