Abstract

In this paper, we extend the recently introduced linear technique for temporal phase reconstruction using optical ultrafast differentiation (PROUD) to achieve full characterization of ultrashort optical pulses with durations down to the picosecond regime using a well-characterized temporal stretcher (e.g., dispersive optical fiber). The proposed method is experimentally demonstrated by precisely characterizing the amplitude and phase temporal profiles of microwatt-power picosecond pulses ranging from 4 to 20ps with both continuous and discrete temporal phase variations. Using this simple mechanism, the same PROUD setup can be used to characterize optical pulses with durations ranging from the picosecond to the nanosecond regime. We provide a comprehensive mathematical analysis of this general PROUD technique: we evaluate in detail the influence of the key specifications (e.g., different sources of noise) of the used components and instruments, namely, optical differentiator, linear temporal stretcher, and time-domain intensity test equipment, on the performance of the PROUD measurement system, particularly in terms of phase sensitivity in the optical pulse characterization.

© 2009 IEEE

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2008 (1)

F. Li, Y. Park, J. Azaña, "Group delay characterization of dispersive devices using a simple temporal intensity measurement setup," IEEE Photon. Technol. Lett. 20, 2042-2044 (2008).

2007 (3)

2006 (2)

C. Dorrer, "High-speed measurements for optical telecommunication systems," IEEE J. Sel. Top. Quantum Electron. 12, 843-857 (2006).

R. Slavík, Y. Park, M. Kulishov, R. Morandotti, J. Azaña, "Ultrafast all-optical differentiators," Opt. Express 14, 10699-10707 (2006).

2005 (2)

2004 (1)

P. Kochaert, M. Haeltermannm, P. Emplit, C. Froehly, "Complete characterization of (ultra) short optical pulse using fast linear detectors," IEEE J. Sel. Top. Quantum Electron. 10, 206-212 (2004).

2003 (1)

2002 (2)

V. Laude, "Noise analysis of the measurement of group delay in Fourier white-light interferometric cross correlation," J. Opt. Soc. Amer. B 19, 1001-1008 (2002).

C. Dorrer, I. Kang, "Simultaneous temporal characterization of telecommunication optical pulses and modulators by use of spectrograms," Opt. Lett. 27, 1315-1317 (2002).

1998 (2)

IEEE J. Sel. Top. Quantum Electron. (2)

C. Dorrer, "High-speed measurements for optical telecommunication systems," IEEE J. Sel. Top. Quantum Electron. 12, 843-857 (2006).

P. Kochaert, M. Haeltermannm, P. Emplit, C. Froehly, "Complete characterization of (ultra) short optical pulse using fast linear detectors," IEEE J. Sel. Top. Quantum Electron. 10, 206-212 (2004).

IEEE Photon. Technol. Lett. (1)

F. Li, Y. Park, J. Azaña, "Group delay characterization of dispersive devices using a simple temporal intensity measurement setup," IEEE Photon. Technol. Lett. 20, 2042-2044 (2008).

J. Opt. Soc. Amer. B (1)

V. Laude, "Noise analysis of the measurement of group delay in Fourier white-light interferometric cross correlation," J. Opt. Soc. Amer. B 19, 1001-1008 (2002).

Opt. Express (1)

Opt. Lett. (9)

Other (2)

W. B. Davenport, W. L. Root, An Introduction to the Theory of Random Signals and Noise (IEEE Press, 1987).

R. Trebino, Frequency-Resolved Optical Gating: The Measurement of Ultrashort Laser Pulses .

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