Abstract

We theoretically study the group-delay characteristics of a silicon microring resonator based on the coupled mode theory, and experimentally demonstrate error-free operations of an on-chip delay line using a silicon-on-insulator (SOI) microring resonator with a 20-$\mu{\hbox {m}}$ radius. Four signals of different modulation formats are examined at 5 Gb/s, including return-to-zero (RZ), carrier-suppressed return-to-zero (CSRZ), return-to-zero duobinary (RZ-DB), and return-to-zero alternate-mark-inversion (RZ-AMI). Bit error rate (BER) measurements show that the maximal delay times with error-free operations are 80, 95, 110, and 65 ps, respectively, corresponding to a fractional group delay of $\sim$0.4, $\sim$0.5, $\sim$0.55, and $\sim$0.35. The differences in delay and signal degradations have been investigated based on the signal spectra and pattern dependences. Although the delays are demonstrated in a single ring resonator, the analysis is applicable in slow-light resonance structures such as all-pass filters (APF) and coupled resonator optical waveguides (CROW).

© 2008 IEEE

PDF Article

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription