Abstract

We present a three-dimensional (3-D) analysis of scattering losses due to sidewall roughness in rectangular dielectric waveguides valid for any refractive-index contrast and field polarization. The analysis is based on the volume current method and uses array factors to introduce significant mathematical simplifications to better understand the influence of individual waveguide parameters on scattering losses. We show that the typical two-dimensional (2-D) analyses can substantially overestimate scattering losses in small waveguides and that scattering losses exhibit considerable polarization dependence. We produce scattering-loss estimates for a wide variety of waveguides and provide guidelines for design of waveguide cross sections that are less sensitive to sidewall roughness.

© 2005 IEEE

PDF Article

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription