Abstract

A new and effective nonintrusive method for characterization of N coupled waveguides is presented. The method is able to furnish readily the coupling parameters of most significance, and furnishes in addition, a way of assessment of overall device quality and performance. The procedure is based on a semi-empirical implementation of coupled mode theory, by means of which different functions are defined for different input configurations. In a well-functioning device, all these function should attain a common single minimum, out of which the coupling coefficient and additional parameters of the device are deduced. Devices were fabricated on Z-cut LiNbO3 crystals by in-diffusion of Titanium. The method was applied in order to measure the wavelength and polarization dependence of the coupling coefficient.

[IEEE ]

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Appl. Opt. (2)

J. Lightwave Technol. (3)

A. Miki, Y. Okamura, and S. Yamamoto, "Optical waveguide directional coupler measurements using a microcomputer-assisted TV camera system," J. Lightwave Technol., vol. 7, pp. 1912-1918, 1989.

M. C. Gabriel and N. A. Whitaker Jr., "Measurement of optical waveguide coupling coefficients using multiple waveguide system," J. Lightwave Technol., vol. 7, pp. 1343-1350, 1989.

W. Streifer, M. Osinski, and A. Hardy, "Reformulation of the coupled-mode theory of multiwaveguide systems," J. Lightwave Technol., vol. 5, pp. 1-4, 1987.

Opt. Lett. (1)

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