Abstract

In the interpretation of optical low-coherence reflectometry measurements, the reflectivity of the device under test is in general supposed to be with a slow dependency on optical wavelength. However, recent research aims at investigating strongly wavelength-dependent devices, such as fiber Bragg gratings and semiconductor lasers. In this paper, a general theory including spectral filtering effects is developed. It appears as a generalization of previously reported results only valid under special conditions.

[IEEE ]

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References

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  1. A. Kohlhaas, C. Fr mchen, and E. Brinkmeyer, "High-resolution OCDR for testing integrated-optical waveguides: Dispersion-corrupted experimental data corrected by a numerical algorithm," J. Lightwave Technol., vol. 9, pp. 1493-1502, Nov. 1991.
  2. U. Wiedmann, P. Gallion, Y. Jaou n, and C. Chabran, "Analysis of distributed feedback lasers using optical low-coherence reflectometry," J. Lightwave Technol., vol. 16, pp. 864-869, May 1998.

J. Lightwave Technol. (2)

A. Kohlhaas, C. Fr mchen, and E. Brinkmeyer, "High-resolution OCDR for testing integrated-optical waveguides: Dispersion-corrupted experimental data corrected by a numerical algorithm," J. Lightwave Technol., vol. 9, pp. 1493-1502, Nov. 1991.

U. Wiedmann, P. Gallion, Y. Jaou n, and C. Chabran, "Analysis of distributed feedback lasers using optical low-coherence reflectometry," J. Lightwave Technol., vol. 16, pp. 864-869, May 1998.

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