Abstract

We report the measurement of cavity propagation losses in nearly single-mode semiconductor waveguide-coupled ring and disk microcavity optical resonators. Using a novel 10.5-{ {\mu}}m-diameter ring resonator, we measure transverse electric (TE) and transverse magnetic (TM) field intensity losses in 0.35-{ {\mu}}m-wide ring waveguide cavities in the 1.55-{ {\mu}}m-wavelength region. We present the experimental results for nanofabricated AlGaAs/GaAs 10.5-{ {\mu}}m-diameter ring and disk resonators to quantify cavity losses and to show the feasibility of these promising and robust submicron-scale devices.

[IEEE ]

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Appl. Opt. (1)

W. Stutius and W. Streifer, "Silicon nitride films on silicon for optical waveguides," Appl. Opt., vol. 31, pp. 3218-3222, Dec. 1977.

J. Lightwave Technol. (3)

T. Kominato, Y. Ohmori, N. Takato, H. Okazaki, and M. Yasu, "Ring resonators composed of GeO_2-doped silica waveguides," J. Lightwave Technol., vol. 10, pp. 1781-1787, Dec. 1992.

R. Adar, M. R. Serbin, and V. Mizrahi, "Less than 1 dB per meter propagation loss of silica waveguides measured using a ring resonator," J. Lightwave Technol., vol. 12, pp. 1369-1372, Aug. 1994.

--, "FDTD microcavity simulations: Design and experimental realization of waveguide-coupled single-mode ring and whispering-gallery-mode disk resonators," J. Lightwave Technol., vol. 15, pp. 2154-2165, Nov. 1997.

Opt. Lett. (3)

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