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Optica Publishing Group
  • Journal of Lightwave Technology
  • Vol. 16,
  • Issue 4,
  • pp. 573-
  • (1998)

Normalized Analysis for the Sensitivity Optimization of Integrated Optical Evanescent-Wave Sensors

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Abstract

Closed-form analytical expressions and normalized charts provide the conditions for the maximum sensitivity of transverse electric (TE) and transverse magnetic (TM) evanescent-wave step-index waveguide sensors. The analysis covers both cases where the measurand is homogeneously distributed in the semi-infinite waveguide cover, and where it is an ultrathin film at the waveguide-cover interface.

[IEEE ]

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