Abstract

A normalized design approach has been developed that allows rapid estimates of parameters like the bend loss, finesse, and free spectral range of the fundamental microresonator modes of two-and three-dimensional microresonators. Based on this approach, the minimum size for a given finesse and the free spectral range for microresonators in silicon oxynitride technology are investigated.

© 2003 IEEE

PDF Article

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription