Abstract

This paper presents an efficient approach for the analysis of graded-index profile waveguides. The variation of the index of refraction is modeled considering a sufficient number of concentric dielectric layers, each with a different index of refraction. The propagation constant in the layered structure is calculated by setting up a full-wave equivalent circuit, which allows the derivation of the system equation for the whole structure. Two examples are given, including validation with the commercial software Ansoft HFSS.

© 2007 IEEE

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