Abstract
A
novel method is introduced using to evaluate the quality of thin-film transistor
(TFT) array for driving active-matrix display (OLED). By
the means of this method, the operation states of the TFT or the defects of
TFT can be judged. It is a current testing method with the advantages of fast
response, excellent precision, no effect to aperture and
no damage to the display array.
© 2008 IEEE
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