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Optica Publishing Group
  • Journal of Display Technology
  • Vol. 4,
  • Issue 2,
  • pp. 229-232
  • (2008)

A Testing Method on Poly-Si Thin-Film Transistor Array for Active-Matrix Organic Emitting Display

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Abstract

A novel method is introduced using to evaluate the quality of thin-film transistor (TFT) array for driving active-matrix display (OLED). By the means of this method, the operation states of the TFT or the defects of TFT can be judged. It is a current testing method with the advantages of fast response, excellent precision, no effect to aperture and no damage to the display array.

© 2008 IEEE

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