Abstract
A device/circuit mixed-mode simulation method is proposed to
effectively characterize the physical effects of the structure parameters
and external noise signals on the sensing performance of projected-capacitive
touch sensor devices for physical explanation and optimal design in
touch screen applications. With this method, the electrostatic characteristics
of the intrinsic capacitive sensor structure were obtained by numerical
simulations, and then embedded into the circuit simulation environment
to predict the resulted sensing performance. A single-layer mutual
capacitance structure sensor device sample was fabricated to verify
the simulation method. The related physical mechanisms during the
touching procedure were analyzed with the simulation method, which
was in agreement with the experimental measurement results.
© 2014 IEEE
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