Abstract
Bending tester in reciprocating motion is adopted to
study the fatigue resistance and fatigue life of indium tin oxide (ITO) films
deposited on poly(ethylene terephthalate) (PET) substrate with various prestrain
levels. A commercial micro-compression tester and ANSYS-Workbench software
are used to determine the stress versus strain curves, and thus the strain
energy of a fixed volume in the specimen. A bending tester without a cycle
limitation is designed to carry out ITO-film fatigue life tests. Two points
symmetric with respect to the specimen's central line are set to measure the
film's electrical resistance variation with the number of cycles in reciprocating
motion. The number of cycles in the bending tests corresponding to the fatigue
life of ITO film is determined on the bases of both the strain at which 63%
of the material fails and the electrical resistance which has 10% rise w.r.t.
the initial one before bending test. The mean electrical resistance increases
with increasing number of cycles and prestrain applied to the PET substrate.
Of the four substrate prestrains tested (0%, 2%, 4%, and 6%), the change in
electrical resistance
$({\mit\Delta}R)$
between the beginning and end of the test was highest for the PET-6%/ITO
specimen regardless of the maximum acceleration of the tester. With the same
substrate's prestrain and at the same maximum acceleration, the number of
cycles for fatigue life predicted by these two models are fairly close. Increasing
either the substrate prestrain or the jig's acceleration decreases the alternating
stress and increases the strain during reciprocating motion, lowering the
fatigue life of the film. The strain energy defined for a fixed volume in
the specimen is found always asymptotic to a constant value. The number of
cycles corresponding to the beginning of this constant strain energy is found
close to those of fatigue cycles predicted by the models mentioned above.
The strain energy method is thus provided as an effective way to predict the
fatigue life of the specimens without fatigue limit in the
$SN$
curve.
© 2013 IEEE
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