Abstract

A novel method is introduced using to evaluate the quality of thin-film transistor (TFT) array for driving active-matrix display (OLED). By the means of this method, the operation states of the TFT or the defects of TFT can be judged. It is a current testing method with the advantages of fast response, excellent precision, no effect to aperture and no damage to the display array.

© 2008 IEEE

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  1. A. Nathan, G. R. Chaji, S. J. Ashtiani, "Driving schemes for a-Si and LTPS AMOLED displays," J. Display Technol. 1, 267-277 (2005).
  2. S. H. Jung, W. J. Nam, M. K. Han, "A new voltage-modulated AMOLED pixel design compensating for threshold voltage variation in poly-Si TFTs," IEEE Electron Device Lett. 25, 690-692 (2004).
  3. R. Hattori, T. Tsukamizu, R. Tsuchiya, K. Miyake, Y. He, "Current-writing active-matrix circuit for organic light-emitting diode display using a-Si:H thin-film-transistor," IEICE Trans. Electron. E83-C, (2000).
  4. S. K. Bhowmick, B. Mazhari, "An impoved Four TFT circuit for active-matrix organic light emitting diode display," SID Symp. Dig.Tech. Papers (2002) pp. 606-609.
  5. Y. He, R. Hattori, J. Kanicki, "Four-thin film transistor pixel electrode circuits for active-matrix organic light-emitting displays," Jpn. J. Appl. Phys. 40, 1199-1208 (2001) Part 1.
  6. K. J. Weingarten, M. J. W. Rodwell, D. M. Bloom, "Picosecond optical sampling of GaAs integrated circuits," IEEE J. Quantum Electron. 24, 198-220 (1988).
  7. M. Brunner, R. Schmid, R. Schmitt, D. Winkler, "In-process flat-panel-display testing with electron beams," Proc. SID Int.Symp. Dig. Tech. Papers (1994) pp. 755.
  8. Y. C. Lin, H. P. D. Shieh, "In-process functional testing of pixel circuit in AM-OLEDs," IEEE Trans. Electron Devices 52, 2157-2161 (2005).

2005 (2)

A. Nathan, G. R. Chaji, S. J. Ashtiani, "Driving schemes for a-Si and LTPS AMOLED displays," J. Display Technol. 1, 267-277 (2005).

Y. C. Lin, H. P. D. Shieh, "In-process functional testing of pixel circuit in AM-OLEDs," IEEE Trans. Electron Devices 52, 2157-2161 (2005).

2004 (1)

S. H. Jung, W. J. Nam, M. K. Han, "A new voltage-modulated AMOLED pixel design compensating for threshold voltage variation in poly-Si TFTs," IEEE Electron Device Lett. 25, 690-692 (2004).

2001 (1)

Y. He, R. Hattori, J. Kanicki, "Four-thin film transistor pixel electrode circuits for active-matrix organic light-emitting displays," Jpn. J. Appl. Phys. 40, 1199-1208 (2001) Part 1.

2000 (1)

R. Hattori, T. Tsukamizu, R. Tsuchiya, K. Miyake, Y. He, "Current-writing active-matrix circuit for organic light-emitting diode display using a-Si:H thin-film-transistor," IEICE Trans. Electron. E83-C, (2000).

1988 (1)

K. J. Weingarten, M. J. W. Rodwell, D. M. Bloom, "Picosecond optical sampling of GaAs integrated circuits," IEEE J. Quantum Electron. 24, 198-220 (1988).

IEEE Electron Device Lett. (1)

S. H. Jung, W. J. Nam, M. K. Han, "A new voltage-modulated AMOLED pixel design compensating for threshold voltage variation in poly-Si TFTs," IEEE Electron Device Lett. 25, 690-692 (2004).

IEEE J. Quantum Electron. (1)

K. J. Weingarten, M. J. W. Rodwell, D. M. Bloom, "Picosecond optical sampling of GaAs integrated circuits," IEEE J. Quantum Electron. 24, 198-220 (1988).

IEEE Trans. Electron Devices (1)

Y. C. Lin, H. P. D. Shieh, "In-process functional testing of pixel circuit in AM-OLEDs," IEEE Trans. Electron Devices 52, 2157-2161 (2005).

IEICE Trans. Electron. (1)

R. Hattori, T. Tsukamizu, R. Tsuchiya, K. Miyake, Y. He, "Current-writing active-matrix circuit for organic light-emitting diode display using a-Si:H thin-film-transistor," IEICE Trans. Electron. E83-C, (2000).

J. Display Technol. (1)

Jpn. J. Appl. Phys. (1)

Y. He, R. Hattori, J. Kanicki, "Four-thin film transistor pixel electrode circuits for active-matrix organic light-emitting displays," Jpn. J. Appl. Phys. 40, 1199-1208 (2001) Part 1.

Other (2)

S. K. Bhowmick, B. Mazhari, "An impoved Four TFT circuit for active-matrix organic light emitting diode display," SID Symp. Dig.Tech. Papers (2002) pp. 606-609.

M. Brunner, R. Schmid, R. Schmitt, D. Winkler, "In-process flat-panel-display testing with electron beams," Proc. SID Int.Symp. Dig. Tech. Papers (1994) pp. 755.

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