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OSA Publishing

10 January 2019, Volume 17, Issue 1, pp. 010501-012601   18 articles


Instrumentation, Measurement, and Metrology

Imaging method of single layer graphene on metal substrate based on imaging ellipsometer with large field of view

Chin. Opt. Lett. 17(1), 011201- (2019)  View: PDF

Double-pass grating imaging spectrometer

Chin. Opt. Lett. 17(1), 011202- (2019)  View: PDF

Method for simultaneously and directly measuring all six-DOF motion errors of a rotary axis

Chin. Opt. Lett. 17(1), 011203- (2019)  View: PDF

Participation in the absolute gravity comparison with a compact cold atom gravimeter

Chin. Opt. Lett. 17(1), 011204- (2019)  View: PDF

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