Closely interleaved self-comparison method applied to precise measurement

Fan Zou, Rong Wei, Richang Dong, Tingting Chen, Wenli Wang, and Yuzhu Wang

Chin. Opt. Lett. 14(8), 081201- (2016)  View: PDF

Measurement of small wavelength shifts based on total internal reflection heterodyne interferometry

Meng-Chang Hsieh, Jiun-You Lin, and Chia-Ou Chang

Chin. Opt. Lett. 14(8), 081202- (2016)  View: PDF

Interference-aided spectrum-fitting method for accurate film thickness determination

Xingxing Liu, Shaowei Wang, Hui Xia, Xutao Zhang, Ruonan Ji, Tianxin Li, and Wei Lu

Chin. Opt. Lett. 14(8), 081203- (2016)  View: PDF