OSA Publishing

10 August 2016, Volume 14, Issue 8, pp. 080101-083501   23 articles

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Instrumentation, Measurement, and Metrology

Closely interleaved self-comparison method applied to precise measurement

Chin. Opt. Lett. 14(8), 081201- (2016)  View: PDF

Measurement of small wavelength shifts based on total internal reflection heterodyne interferometry

Chin. Opt. Lett. 14(8), 081202- (2016)  View: PDF

Interference-aided spectrum-fitting method for accurate film thickness determination

Chin. Opt. Lett. 14(8), 081203- (2016)  View: PDF

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