Abstract

The direct replication of W/Si supermirrors is investigated systematically. W/Si supermirrors are fabricated by direct current (DC) magnetron sputtering technology. After deposition, the supermirrors are replicated from the supersmooth mandrels onto ordinary °oat glass substrates by epoxy replication technique. The properties of the supermirrors before and after the replication are characterized by grazing incidence X-ray reflectometry (GIXR) measurement and atomic force microscope (AFM). The results show that before and after replication, the multilayer structures are almost the same and that the surface roughness is 0.240 and 0.217 nm, respectively, which are close to that of the mandrel. It is demonstrated that the W/Si supermirrors are successfully replicated from the mandrel with good performance.

© 2011 Chinese Optics Letters

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